new SEM IT 200

26.03.18

Release of the New Scanning Electron Microscope JSM-IT200 Series InTouchScopeT - Fast observation, analysis and report generation with high performance analytical tool - https://www.jeol.co.jp/en/news/detail/20180326.2547.html


JSM-IT200 InTouchScopeT Scanning Electron Microscope https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Oglasi:

JEOL
Pfeiffer vacuum
Oxford Instruments
RMC Products
Labogene
CryopAL
SPI supplies
VAT AG
HSR AG