News archive
- 03.02.23New FIB
- 24.01.23webinars on solid state batteries
- 13.12.22Viruses under cryo ARM
- 27.09.22Coffee Talks Series
- 17.03.22News for Cryo-Electron-Microscopists
- 03.11.21Omnicontrol; control everything
- 09.08.21Atomic resolution electron microscope
- 21.04.21Do you have a wish regarding additional training?
- 24.03.21Jacomex glove boxes
- 05.03.21Anture article, Cryo Tomography, Cryo TEM, Atribacteria cell membrane structure
- 05.03.21GC-TQMS analytical solutions for food and water safety
- 01.03.21NMR webinar
New FIB
03.02.23
JEOL is pleased to announce the release of its new FIB: JIB-PS500i
The JIB-PS500i provides three solutions to assist TEM specimen preparation. High throughput workflow is assured from specimen preparation to TEM observation.
