News archive
- 29.11.23JEOL webinar
- 16.11.23Use of Labogene freeze dryers
- 08.11.23Particle contamination analysis
- 03.02.23New FIB
- 24.01.23webinars on solid state batteries
- 13.12.22Viruses under cryo ARM
- 27.09.22Coffee Talks Series
- 17.03.22News for Cryo-Electron-Microscopists
- 03.11.21Omnicontrol; control everything
- 09.08.21Atomic resolution electron microscope
- 21.04.21Do you have a wish regarding additional training?
- 24.03.21Jacomex glove boxes
new SEM IT 200
26.03.18
Release of the New Scanning Electron Microscope JSM-IT200 Series InTouchScopeT - Fast observation, analysis and report generation with high performance analytical tool - https://www.jeol.co.jp/en/news/detail/20180326.2547.html
JSM-IT200 InTouchScopeT Scanning Electron Microscope https://www.jeol.co.jp/en/products/detail/JSM-IT200.html